更新時間(jian):2022-08-18
激(ji)光(guang)光(guang)電(dian)探測系(xi)統(tong)線性(xing)性(xing)能檢測裝置(zhi)于透射(she)式和折反式導引(yin)頭(tou)探測器彌散圓調試與導引(yin)頭(tou)光(guang)電(dian)線性(xing)區(qu)測試。
激光光電探測系統線性性能檢測
激光光電探(tan)測系統(tong)線(xian)性(xing)性(xing)能檢(jian)測裝置(zhi)于透射式和折反式導引頭探(tan)測器彌散圓調試與導引頭光電線(xian)性(xing)區測試。
檢測紅(hong)外器(qi)(qi)件(jian)光敏(min)面大小、均勻性、多(duo)元器(qi)(qi)件(jian)的(de)(de)*性及串音情況。這對(dui)于提高(gao)紅(hong)外系(xi)(xi)統(tong)特別是(shi)以探(tan)測器(qi)(qi)為(wei)視場光闌的(de)(de)系(xi)(xi)統(tong)搜索(suo)和跟蹤精度(du),提高(gao)成(cheng)像系(xi)(xi)統(tong)的(de)(de)清晰度(du)都(dou)具有重要(yao)意義。紅(hong)外小光點系(xi)(xi)統(tong)首(shou)先要(yao)檢測光斑彌散圓大小,才(cai)能(neng)投(tou)入使用。迄(qi)今(jin)為(wei)止,幾乎所有的(de)(de)紅(hong)外光學系(xi)(xi)統(tong)的(de)(de)裝校和檢測都(dou)是(shi)在(zai)(zai)可見光譜(pu)區(qu)(qu)進(jin)行。這就要(yao)求光學系(xi)(xi)統(tong)只(zhi)能(neng)設計成(cheng)反射(she)系(xi)(xi)統(tong)。隨(sui)著紅(hong)外儀器(qi)(qi)發展,紅(hong)外透(tou)鏡已經被采用;在(zai)(zai)反射(she)系(xi)(xi)統(tong)中(zhong)常常要(yao)加紅(hong)外波段濾光片;中(zhong)紅(hong)外以上的(de)(de)探(tan)測器(qi)(qi)往(wang)往(wang)都(dou)帶(dai)有透(tou)紅(hong)外而不透(tou)可見光的(de)(de)窗口。帶(dai)有這些光學零件(jian)的(de)(de)紅(hong)外系(xi)(xi)統(tong),裝調和檢測不能(neng)在(zai)(zai)可見光譜(pu)區(qu)(qu)進(jin)行。
激光光電探測系統線性性能檢測技術規格
適用(yong)波長 | 1.06um |
調節方式 | 方位、俯仰和滾(gun)轉調節 |